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8 September 2004 On the fundamental imaging-depth limit in two-photon microscopy
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Abstract
The limit on imaging-depth in two-photon microscopy depends on parameters of the imaging system such as available power, wavelength, numerical aperture, and fluorescencecollection field-of-view and on properties of the sample such as scattering and absorption cross-sections and fluorophore distribution. These dependencies are discussed and strategies for optimizing the imaging depth are presented.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Patrick Theer and Winfried T. Denk "On the fundamental imaging-depth limit in two-photon microscopy", Proc. SPIE 5463, Femtosecond Laser Applications in Biology, (8 September 2004); https://doi.org/10.1117/12.548057
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