Dependence of Hooge constant on mean free paths of materials

Munecazu Tacano; Jan Pavelka; Nobuhisa Tanuma; Saburo Yokokura; Sumihisa Hashiguchi

doi:10.1117/12.547202

25 May 2004 Dependence of Hooge constant on mean free paths of materials

Munecazu Tacano, Jan Pavelka, Nobuhisa Tanuma, Saburo Yokokura, Sumihisa Hashiguchi

Proceedings Volume 5469, Fluctuations and Noise in Materials; (2004) https://doi.org/10.1117/12.547202
Event: Second International Symposium on Fluctuations and Noise, 2004, Maspalomas, Gran Canaria Island, Spain

Abstract

The Hooge parameters of compound semiconductors are found to be in inverse proportional to the mean free paths of materials. The newly developed model of 1/f phonon energy partition fluctuation in thermal equilibrium predicts the value of Hooge parameter as α_H = a/λ, the ratio of the lattice constant a and the mean free path λ. Several reported experimental results on α_H for very pure semiconductors are found on the a/λ line. Experimental verification is given by measuring noise in InGaAs/InAlAs heterostructure, where optical phonon effects can be observed due to negligible impurity scattering. The Hooge parameter of about 1 in p-InGaAs and 10^-3 to 10^-5 in n-InGaAs reflects the two order difference in the mobility and corresponding λ values.

Citation Download Citation

Munecazu Tacano, Jan Pavelka, Nobuhisa Tanuma, Saburo Yokokura, and Sumihisa Hashiguchi "Dependence of Hooge constant on mean free paths of materials", Proc. SPIE 5469, Fluctuations and Noise in Materials, (25 May 2004); https://doi.org/10.1117/12.547202

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