25 May 2004 Phase coexistence and resistance fluctuations in a thin film manganite
Author Affiliations +
Proceedings Volume 5469, Fluctuations and Noise in Materials; (2004) https://doi.org/10.1117/12.547132
Event: Second International Symposium on Fluctuations and Noise, 2004, Maspalomas, Gran Canaria Island, Spain
Abstract
Resistance fluctuations of low strain thin film La0.7Ca0.3MnO3 grown on NdGaO3 are examined. The appearance of two state resistance fluctuations are found to be correlated with the onset of remanent magnetization and not with the onset of percolation-like conduction. Their behavior with current, applied magnetic field, and temperature provide information on the nature of the fluctuation. In contrast to the magnetization at the putative Tc of the thin film, the resistance fluctuations display memory of the applied magnetic filed history. An explanation involving a strain enhanced AF interaction is posited.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Akilan Palanisami, Akilan Palanisami, Neil D. Mathur, Neil D. Mathur, Michael B. Weissman, Michael B. Weissman, } "Phase coexistence and resistance fluctuations in a thin film manganite", Proc. SPIE 5469, Fluctuations and Noise in Materials, (25 May 2004); doi: 10.1117/12.547132; https://doi.org/10.1117/12.547132
PROCEEDINGS
10 PAGES


SHARE
Back to Top