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25 May 2004 Phase coexistence and resistance fluctuations in a thin film manganite
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Proceedings Volume 5469, Fluctuations and Noise in Materials; (2004)
Event: Second International Symposium on Fluctuations and Noise, 2004, Maspalomas, Gran Canaria Island, Spain
Resistance fluctuations of low strain thin film La0.7Ca0.3MnO3 grown on NdGaO3 are examined. The appearance of two state resistance fluctuations are found to be correlated with the onset of remanent magnetization and not with the onset of percolation-like conduction. Their behavior with current, applied magnetic field, and temperature provide information on the nature of the fluctuation. In contrast to the magnetization at the putative Tc of the thin film, the resistance fluctuations display memory of the applied magnetic filed history. An explanation involving a strain enhanced AF interaction is posited.
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Akilan Palanisami, Neil D. Mathur, and Michael B. Weissman "Phase coexistence and resistance fluctuations in a thin film manganite", Proc. SPIE 5469, Fluctuations and Noise in Materials, (25 May 2004);

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