25 May 2004 Noise in solid state sensors
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Proceedings Volume 5472, Noise and Information in Nanoelectronics, Sensors, and Standards II; (2004) https://doi.org/10.1117/12.546736
Event: Second International Symposium on Fluctuations and Noise, 2004, Maspalomas, Gran Canaria Island, Spain
Abstract
In this survey at first the general figures of merit of solid-state sensors as sensitivity, dynamic range and noise equivalent signal are defined. With this the main phenomenological parameters as tangential sensitivity, noise figure, noise temperature, noise resistance is treated, and the usefulness of the tangential sensitivity is emphasized. The difference between the phenomenological parameters and the physical noise is pointed out with examples. Finally the basic noise aspects of some often used classical sensor elements as resistance; Hall-plate and diode are reviewed.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Bela Szentpali, Bela Szentpali, } "Noise in solid state sensors", Proc. SPIE 5472, Noise and Information in Nanoelectronics, Sensors, and Standards II, (25 May 2004); doi: 10.1117/12.546736; https://doi.org/10.1117/12.546736
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