Paper
25 May 2004 Statistical properties of low-frequency noise of optoelectronic coupled devices
Alicja Krystyna Konczakowska, Jacek A. Cichosz, Barbara Stawarz
Author Affiliations +
Proceedings Volume 5472, Noise and Information in Nanoelectronics, Sensors, and Standards II; (2004) https://doi.org/10.1117/12.547614
Event: Second International Symposium on Fluctuations and Noise, 2004, Maspalomas, Gran Canaria Island, Spain
Abstract
The low frequency noise generated by optoelectronic coupled devices (OCDs) was measured in the system designed and constructed by authors. The investigations were carried out for optoelectronic devices of CNY 17 type. Number of N = 106 noise samples was recorded for statistical analysis for each investigated OCD. The amplitude distributions and cumulative distribution functions were calculated for each samples data records. Statistical properties of low frequency noise of OCDs were established by estimating following parameters: mean value, variance, skewness and kurtosis. The investigated time series have not Gaussion distributions. Stationarity of the four estimated parameters was tested. It was found that the probability density function of noise could be used for the recognition of the Random Telegraph Signal (RTS) noise together with spectrum analysis.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Alicja Krystyna Konczakowska, Jacek A. Cichosz, and Barbara Stawarz "Statistical properties of low-frequency noise of optoelectronic coupled devices", Proc. SPIE 5472, Noise and Information in Nanoelectronics, Sensors, and Standards II, (25 May 2004); https://doi.org/10.1117/12.547614
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KEYWORDS
Statistical analysis

Optoelectronic devices

Optoelectronics

Diodes

Interference (communication)

Measurement devices

Optical amplifiers

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