14 July 2004 Microscopy of Si and Ge nanospherical particles
Author Affiliations +
We have fabricated nanometer spherical silicon and germanium particles by dissolving semiconductors in some melted metals (aluminum, indium). The first transmission electron microscopy images and electron microdiffraction patterns of the spherical Si and Ge particles are presented. The obtained spherical particles have sizes from hundreds nanometers to tens angstroms, the diameters of the smallest ones are about 1.5 nm that are close to calculated sizes of hypothetic silicon "fullerenes" Si60.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Uryi Petrovich Volkov, Uryi Petrovich Volkov, Vil B. Baibyrin, Vil B. Baibyrin, Roman A. Yakimenko, Roman A. Yakimenko, Nikolai P. Konnov, Nikolai P. Konnov, Andrei P. Mironychev, Andrei P. Mironychev, } "Microscopy of Si and Ge nanospherical particles", Proc. SPIE 5475, Saratov Fall Meeting 2003: Coherent Optics of Ordered and Random Media IV, (14 July 2004); doi: 10.1117/12.568563; https://doi.org/10.1117/12.568563


Lightning-rod effect near sharp dielectric structures
Proceedings of SPIE (March 24 2015)
Oxidation of small metal particles
Proceedings of SPIE (October 21 1993)
Unique case study of low yield analysis of 1.5 um...
Proceedings of SPIE (September 10 1997)

Back to Top