14 July 2004 Microscopy of Si and Ge nanospherical particles
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Abstract
We have fabricated nanometer spherical silicon and germanium particles by dissolving semiconductors in some melted metals (aluminum, indium). The first transmission electron microscopy images and electron microdiffraction patterns of the spherical Si and Ge particles are presented. The obtained spherical particles have sizes from hundreds nanometers to tens angstroms, the diameters of the smallest ones are about 1.5 nm that are close to calculated sizes of hypothetic silicon "fullerenes" Si60.
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Uryi Petrovich Volkov, Uryi Petrovich Volkov, Vil B. Baibyrin, Vil B. Baibyrin, Roman A. Yakimenko, Roman A. Yakimenko, Nikolai P. Konnov, Nikolai P. Konnov, Andrei P. Mironychev, Andrei P. Mironychev, } "Microscopy of Si and Ge nanospherical particles", Proc. SPIE 5475, Saratov Fall Meeting 2003: Coherent Optics of Ordered and Random Media IV, (14 July 2004); doi: 10.1117/12.568563; https://doi.org/10.1117/12.568563
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