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4 June 2004 Computation of internal reflection of light-scattering layer
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Proceedings Volume 5477, Sixth International Conference on Correlation Optics; (2004) https://doi.org/10.1117/12.559838
Event: Sixth International Conference on Correlation Optics, 2003, Chernivsti, Ukraine
Abstract
The Kubelka-Munk model is widely applied to the investigation of light-scattering layers of various kinds, such as biotissues, leaves of plants, paints etc. Disadvantage of this model is that it does not take into account the real interfaces. As a result, the measured magnitudes of optical characteristics must to be corrected. In part, one must to know the coefficient of internal reflection of light-scattering layer. In this paper we propose the method for evaluation of this parameter by statistical simulation and present the results of computation.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Oleg N. Kozakov, N. L. Kirsh, and T. M. Kunetskaya "Computation of internal reflection of light-scattering layer", Proc. SPIE 5477, Sixth International Conference on Correlation Optics, (4 June 2004); https://doi.org/10.1117/12.559838
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