Paper
4 June 2004 Optical correlation diagnostics of rough surfaces: statistical and fractal approach
Author Affiliations +
Proceedings Volume 5477, Sixth International Conference on Correlation Optics; (2004) https://doi.org/10.1117/12.559766
Event: Sixth International Conference on Correlation Optics, 2003, Chernivsti, Ukraine
Abstract
New feasibilities are considered for optical correlation diagnostics of rough surfaces with different distributions of irregularities. The influence of deviations of the height surface roughness distribution from a Gaussian probability distribution on the accuracy of optical analysis is discussed. The possibilities for optical diagnostics of fractal surface structures are shown and the set of statistical and dimensional parameters of the scattered fields for surface roughness diagnostics is determined. Fast operating measuring devices for roughness control are proposed.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Oleg V. Angelsky, Peter P. Maksimyak, Dimitry N. Burcovets, and I. M. Grigiraschuk "Optical correlation diagnostics of rough surfaces: statistical and fractal approach", Proc. SPIE 5477, Sixth International Conference on Correlation Optics, (4 June 2004); https://doi.org/10.1117/12.559766
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KEYWORDS
Fractal analysis

Diagnostics

Surface roughness

Computer simulations

Diffraction

CCD cameras

Control systems

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