22 July 2004 Irradiation effects in electronic components of the RPC trigger for the CMS experiment
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Proceedings Volume 5484, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments II; (2004) https://doi.org/10.1117/12.568897
Event: Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments II, 2003, Wilga, Poland
Abstract
The results of proton radiation test of electronic devices for RPC trigger electronic system of CMS detector are presented. For Xilinx Spartan-IIE FPGA the cross section for Single Event Upsets (SEUs) in configuration bits was measured. The dynamic SEUs in flip-flops was also investigated, but not observed. For the FLASH memories no single upsets were detected, but after a huge dose permanent damages of devices were observed. For SDRAM memories, the SEU cross section was measured. A brief description of radiation inducted effects in FPGAs, SRAM and FLASH memories is also presented.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Karol Bunkowski, Ivan I.K. Kassamakov, J. Krolikowski, Krzysztof Kierzkowski, Maciej Ignacy Kudla, Teppo Maenpaa, Krzysztof T. Pozniak, Dominik Rybka, Eija Tuominen, Donatella Ungaro, Wojciech M. Zabolotny, "Irradiation effects in electronic components of the RPC trigger for the CMS experiment", Proc. SPIE 5484, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments II, (22 July 2004); doi: 10.1117/12.568897; https://doi.org/10.1117/12.568897
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