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12 October 2004 NICMOS: lessons learned for future space infrared instrumentation
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Abstract
Temperature variations in the NICMOS detectors arise from a variety of thermal sources. These thermal variations lead to several image artifacts which must be removed before making quantitative scientific measurements from NICMOS data. Future instruments would do well to minimize sources of thermal instabilities in their detectors. A related problem is the inability to directly measure detector temperature from bias due to the instability of the low-voltage power supply in NICMOS. Identifying ways to directly monitor detector temperatures would be an important benefit for future missions.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Keith S. Noll, Louis E. Bergeron, Thomas Wiklind, Santiago Arribas, Roelof S. de Jong, Sangetta Malhotra, Bahram Mobasher, Erin Roye, Alfred B. Schultz, Chun Xu, Daniela Calzetti, Mark Dickinson, and Megan L. Sosey "NICMOS: lessons learned for future space infrared instrumentation", Proc. SPIE 5487, Optical, Infrared, and Millimeter Space Telescopes, (12 October 2004); https://doi.org/10.1117/12.551574
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