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25 October 2004 Characterization of adaptive optics at Keck Observatory: part II
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This paper is a continuation of the characterization of adaptive optics (AO) at Keck Observatory (SPIE 5169-01). The bandwidth and measurement noise error terms are often the important sources of wave-front error. Here, we show how the magnitude of these two terms is estimated. First, the Bayesian wave-front reconstructor employed at Keck Observatory is presented and shown to perform better than a conventional SVD reconstructor. A novel technique used to estimate the size of the spot on a Shack-Hartmann wave-front sensor quad cell detector is introduced, along with experimental results using this technique. The spot size is an essential component of the dynamic model of the AO system, which is presented and used to find the bandwidth and noise error terms.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Marcos Alejandro van Dam, David Le Mignant, and Bruce A. Macintosh "Characterization of adaptive optics at Keck Observatory: part II", Proc. SPIE 5490, Advancements in Adaptive Optics, (25 October 2004);


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