20 October 2004 Metrology system for Space Interferometry Mission's system testbed 3
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Abstract
The Space Interferometry mission's nano-meter class System Testbed has implemented an external metrology system to monitor changes in the length & orientation of the science interferometer baseline vector, which cannot be monitored directly. The output of the system is used in real time fringe tracking of dim stars. This paper describes the external metrology system, its mathematical representation, limitations, and method for estimating the length & orientation of the science baseline vector. Simulations and current system performance are presented and discussed.
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Oscar S. Alvarez-Salazar, Oscar S. Alvarez-Salazar, Alireza Azizi, Alireza Azizi, Yekta Gursel, Yekta Gursel, George Sun, George Sun, Jens Fischer, Jens Fischer, Arshak Avanesyan, Arshak Avanesyan, John Shaw, John Shaw, } "Metrology system for Space Interferometry Mission's system testbed 3", Proc. SPIE 5491, New Frontiers in Stellar Interferometry, (20 October 2004); doi: 10.1117/12.549694; https://doi.org/10.1117/12.549694
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