20 October 2004 Metrology system for Space Interferometry Mission's system testbed 3
Author Affiliations +
Abstract
The Space Interferometry mission's nano-meter class System Testbed has implemented an external metrology system to monitor changes in the length & orientation of the science interferometer baseline vector, which cannot be monitored directly. The output of the system is used in real time fringe tracking of dim stars. This paper describes the external metrology system, its mathematical representation, limitations, and method for estimating the length & orientation of the science baseline vector. Simulations and current system performance are presented and discussed.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Oscar S. Alvarez-Salazar, Alireza Azizi, Yekta Gursel, George Sun, Jens Fischer, Arshak Avanesyan, John Shaw, "Metrology system for Space Interferometry Mission's system testbed 3", Proc. SPIE 5491, New Frontiers in Stellar Interferometry, (20 October 2004); doi: 10.1117/12.549694; https://doi.org/10.1117/12.549694
PROCEEDINGS
12 PAGES


SHARE
RELATED CONTENT

Search for terrestrial planets with SIM Planet Quest
Proceedings of SPIE (June 28 2006)
SIMsim an end to end simulator for the SIM...
Proceedings of SPIE (September 16 2004)
Overview of SIM external calibration
Proceedings of SPIE (February 26 2003)
SIM vs. SOS: a space interferometry trade study
Proceedings of SPIE (July 24 1998)
SIM system testbed 3 baseline stellar interferometer on a...
Proceedings of SPIE (October 20 2004)

Back to Top