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20 October 2004 Metrology system for Space Interferometry Mission's system testbed 3
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The Space Interferometry mission's nano-meter class System Testbed has implemented an external metrology system to monitor changes in the length & orientation of the science interferometer baseline vector, which cannot be monitored directly. The output of the system is used in real time fringe tracking of dim stars. This paper describes the external metrology system, its mathematical representation, limitations, and method for estimating the length & orientation of the science baseline vector. Simulations and current system performance are presented and discussed.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Oscar S. Alvarez-Salazar, Alireza Azizi, Yekta Gursel, George Sun, Jens Fischer, Arshak Avanesyan, and John Shaw "Metrology system for Space Interferometry Mission's system testbed 3", Proc. SPIE 5491, New Frontiers in Stellar Interferometry, (20 October 2004);


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