29 September 2004 Low-noise double-sided silicon strip detector for soft gamma-ray Compton camera
Author Affiliations +
A Semiconductor Multiple-Compton Telescope (SMCT) is expected to proceed a high-sensitivity soft gamma-ray observation in the energy range of 0.1-20 MeV. Double-sided silicon strip detector (DSSD) is one of key technologies for constructing SMCT, as well as the high-stopping semiconductor CdTe, because of its high energy resolution and high scattering efficiency. We have developed a low-noise system of DSSD and frontend LSI for SMCT, by optimizing geometrical structures of DSSD. We have thus obtained an energy resolution of 1.3 keV (FWHM) for 60 keV and 122 keV at -10°C in the multi-channel reading. Gamma-ray responses such as image flatness and charge splittings were found to be not problematic. We also demonstrated that our system achieved the good angular resolution close to the Doppler-broadening limit in the Compton imaging by two DSSDs.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yasushi Fukazawa, Yasushi Fukazawa, Tatsuya Nakamoto, Tatsuya Nakamoto, Naoyuki Sawamoto, Naoyuki Sawamoto, Shingo Uno, Shingo Uno, Takashi Ohsugi, Takashi Ohsugi, Hiroyasu Tajima, Hiroyasu Tajima, Tadayuki Takahashi, Tadayuki Takahashi, Takefumi Mitani, Takefumi Mitani, Takaaki Tanaka, Takaaki Tanaka, Kazuhiro Nakazawa, Kazuhiro Nakazawa, } "Low-noise double-sided silicon strip detector for soft gamma-ray Compton camera", Proc. SPIE 5501, High-Energy Detectors in Astronomy, (29 September 2004); doi: 10.1117/12.550764; https://doi.org/10.1117/12.550764


Fisher information as a gamma-ray detector design tool
Proceedings of SPIE (September 17 2014)
The silicon micro strip detector plane for the LOFT wide...
Proceedings of SPIE (September 16 2012)
Results of a Si/CdTe Compton telescope
Proceedings of SPIE (September 16 2005)
Concept of a small satellite for sub MeV and MeV...
Proceedings of SPIE (September 16 2012)
ASPEX: a prêt-à-porter all sky monitor
Proceedings of SPIE (June 14 2006)

Back to Top