14 October 2004 Effects of film structure on photoluminescent emission properties of nanostructured Y2O3:Eu thin films
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Abstract
Nanostructured europium-doped yttrium oxide (Y2O3:Eu) films were fabricated using electron beam evaporation, in combination with the Glancing Angle Deposition (GLAD) technique. GLAD makes use of controlled substrate motion during physical vapour deposition (PVD) of a thin film resulting in a high degree of control over the nanostructure of the film. Films were deposited using pre-doped Y2O3:Eu source material. Scanning electron microscopy was used to characterize film nanostructure, while the light emission properties of these films were characterized by photoluminescence measurements. Films of four different nanostructures were used in this study: chevrons, pillars, helices, and normally-deposited solid thin films. For each film nanostructure, measurements of the angular dependence of the intensity of the emitted light, as well as absolute brightness, were obtained and compared. The polarization of the light emitted from the chevron film was also examined using a linear polarizer to analyze the polarization state. Measurements of the selective transmission of circularly polarized light through the helical samples were obtained using variable angle spectroscopic ellipsometry.
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Peter C. P. Hrudey, Michael Taschuk, Ying Y. Tsui, Robert Fedosejevs, Michael J. Brett, "Effects of film structure on photoluminescent emission properties of nanostructured Y2O3:Eu thin films", Proc. SPIE 5510, Nanophotonic Materials, (14 October 2004); doi: 10.1117/12.559957; https://doi.org/10.1117/12.559957
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