19 October 2004 Localization-delocalization transition in metal-dielectric films
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Abstract
Anderson localization in random potential fields has been studied extensively for the last fifty years. It is commonly accepted that in 1D and 2D systems characterized by non-correlated random potential distributions, all states are exponentially localized. In this paper we investigate the eigen-problem for Surface Plasmons (SP) in random metal-dielectric films. We show that short-range correlations presented in the governing Kirchhoff's Hamiltonian (KH) result in delocalization of the eigenstates at the band center. The delocalization is shown to be manifested through power law singularities for the density of states and SP localization lengths. The study of the system size dependence of the nearest neighbor's level spacing distributions shows a gradual shift of the SP eigen-problem from a metallic phase for small system sizes into an insulating quantum phase for infinite systems. It reveals a genuine metal-insulator transition that takes place in the composite and is characterized by quantum percolation threshold Pq which is higher than the corresponding geometrical critical concentration Pc.
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Dentcho A. Genov, Andrey K. Sarychev, Vladimir M Shalaev, "Localization-delocalization transition in metal-dielectric films", Proc. SPIE 5512, Plasmonics: Metallic Nanostructures and Their Optical Properties II, (19 October 2004); doi: 10.1117/12.555735; https://doi.org/10.1117/12.555735
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