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14 October 2004 Nanocrystal superlattice imaging by atomic force microscopy
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Abstract
Applicability of Atomic Force Microscopy (AFM) for structural characterization of nanocrystal superlattices is demonstrated on high-resolution imaging of superlattices formed by thiol stabilized gold nanoparticles on carbon coated and hydrophobic supports. Thin (<1nm) uniform coating of the samples with metal film before imaging was found to eliminate the undesirable effects of tip-sample interaction. Size and interparticle spacing are in excellent agreement with transmission electron microscopy results. AFM can be used as a complementary technique for nanocrystal superlattice structural characterization providing possibilities for crystal growth investigation on a variety of supports of practical interest and high resolution of the surface structure of superlattice structures.
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Peter K. Stoimenov, Savka I. Stoeva, B.L.V. Prasad, Christopher M. Sorensen, and Kenneth J. Klabunde "Nanocrystal superlattice imaging by atomic force microscopy", Proc. SPIE 5513, Physical Chemistry of Interfaces and Nanomaterials III, (14 October 2004); https://doi.org/10.1117/12.558429
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