22 October 2004 Design of an elliptical crystal spectrometer for diagnosing pulsed plasma x-ray
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Abstract
A novel elliptical crystal spectrometer has been designed and manufactured to diagnose pulsed plasmas x-ray. The light path is designed according to the elliptical focusing property. The spectrometer is composed of the elliptical x-ray analyzer, the alignment devices, the vacuum system, the ports of the spectral detectors for x-ray CCD camera and x-ray streak camara, the supporting base, and the adapting flange to the target chamber. The target-shooting experiment was performed at the XG-Π and SGΠlaser facilities for testing the spectrometer. The optical system, optoelectronic machinery system, experimental results are discussed in this paper.
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Xianxin Zhong, Xiancai Xiong, Shali Xiao, Yu Chen, Jiayu Qian, Jie Gao, "Design of an elliptical crystal spectrometer for diagnosing pulsed plasma x-ray", Proc. SPIE 5524, Novel Optical Systems Design and Optimization VII, (22 October 2004); doi: 10.1117/12.557423; https://doi.org/10.1117/12.557423
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