22 October 2004 Double-channel crystal spectrograph for measuring plasma x-ray in the 1.33-2.46-nm region
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Abstract
In order to measure laser-produced plasma x-ray in the 1.33-2.46-nm region, an elliptical crystal spectrograph has been designed and fabricated. The potassium acid phthalate (KAP) crystal with a 2d spacing of 2.663 nm is used as the x-ray dispersive element, it is elliptically bent and glued on a rustless-steel substrate with a 0.9586 eccentricity and a 1350-mm focal distance. The spectrograph is equipped with an x-ray charge-coupled device (CCD) camera for recording the space-resolved spectrum on one port, and an x-ray streak camera for recording the time-resolved spectrum on another port. The first testing experiment was carried out on the XG-2 target chamber, the experimental results demonstrate that the spectral resolution is about 640 for this spectrograph.
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Xiancai Xiong, Xiancai Xiong, Xianxin Zhong, Xianxin Zhong, Shali Xiao, Shali Xiao, Yu Chen, Yu Chen, Guohong Yang, Guohong Yang, Jie Gao, Jie Gao, } "Double-channel crystal spectrograph for measuring plasma x-ray in the 1.33-2.46-nm region", Proc. SPIE 5524, Novel Optical Systems Design and Optimization VII, (22 October 2004); doi: 10.1117/12.555653; https://doi.org/10.1117/12.555653
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