Extended depth of field of microscope objective for particle tracking

Xinping Liu; Xianyang Cai; Chander P. Grover

doi:10.1117/12.561079

22 October 2004 Extended depth of field of microscope objective for particle tracking

Xinping Liu, Xianyang Cai, Chander P. Grover

Proceedings Volume 5524, Novel Optical Systems Design and Optimization VII; (2004) https://doi.org/10.1117/12.561079
Event: Optical Science and Technology, the SPIE 49th Annual Meeting, 2004, Denver, Colorado, United States

Abstract

We developed a method of extending the depth of field of a microscope objective specifically used in an imaging system designed for small particle tracking. We extended the depth of field by inserting a quartic phase plate near the aperture stop plane of an objective. An optimum quartic phase plate was designed for a conventional 100X/0.8 microscope objective, and the simulation results predicated that the depth of field of the new objective could be increased more than twofold in comparison with an objective having no such phase plate.

Citation Download Citation

Xinping Liu, Xianyang Cai, and Chander P. Grover "Extended depth of field of microscope objective for particle tracking", Proc. SPIE 5524, Novel Optical Systems Design and Optimization VII, (22 October 2004); https://doi.org/10.1117/12.561079

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