Polarization scatter measurements with a Mueller matrix imaging polarimeter

Brian J. DeBoo; Russell Chipman

doi:10.1117/12.560202

15 October 2004 Polarization scatter measurements with a Mueller matrix imaging polarimeter

Brian J. DeBoo, Russell Chipman

Proceedings Volume 5526, Optical Systems Degradation, Contamination, and Stray Light: Effects, Measurements, and Control; (2004) https://doi.org/10.1117/12.560202
Event: Optical Science and Technology, the SPIE 49th Annual Meeting, 2004, Denver, Colorado, United States

Abstract

A Mueller matrix imaging polarimeter is used to acquire polarization-sensitive images of seven different manmade samples in multiple scattering geometries. Successive Mueller matrix images of a sample with changing incidence and scatter angles are used to develop a Mueller matrix bidirectional reflectance distribution function for the sample in one plane of measurement. The Mueller matrix bidirectional reflectance distribution functions are compared, and patterns are noted. The most significant data for the scattering samples measured occurs along the diagonal of the respective Mueller matrices, indicating significant depolarization effects. Reduced depolarization data in the form of the average degree of polarization (of exiting light) for each sample is examined as a function of changing scattering geometry. Five of seven manmade samples exhibit an inverted Gaussian profile of depolarization with changing scattering geometry, the shape of which may prove useful for measuring sample properties (e.g. roughness) and for classifying or categorizing samples in a remote sensing scheme. Depolarization differences for each sample in response to changing incident polarization states are also examined, and a new metric, the degree of polarization surface, has been developed to visualize all such data simultaneously.

Citation Download Citation

Brian J. DeBoo and Russell Chipman "Polarization scatter measurements with a Mueller matrix imaging polarimeter", Proc. SPIE 5526, Optical Systems Degradation, Contamination, and Stray Light: Effects, Measurements, and Control, (15 October 2004); https://doi.org/10.1117/12.560202

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