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29 September 2004 An optical source for characterizing CMOS imagers
Jed J. Hancock; Doran J. Baker; Gene A. Ware
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Proceedings Volume 5529, Nonimaging Optics and Efficient Illumination Systems; (2004) https://doi.org/10.1117/12.561299
Event: Optical Science and Technology, the SPIE 49th Annual Meeting, 2004, Denver, Colorado, United States
Abstract
To characterize CMOS imagers an LED-based multi-spectral optical source system was designed and tested which is capable of illuminating a 15-mm field at a conjugate distance of 50 mm with 98 percent uniformity. The calibration source is comprised of an array of RGB semiconductor LEDs, an IR cutooff filter and a diffusing lens. The system is integrated into an anodized aluminum housing. The spatial uniformity of the LED optical source was compared with an optical integrating sphere and an Optoliner projection system.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
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Jed J. Hancock, Doran J. Baker, and Gene A. Ware "An optical source for characterizing CMOS imagers", Proc. SPIE 5529, Nonimaging Optics and Efficient Illumination Systems, (29 September 2004); https://doi.org/10.1117/12.561299
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