Characterization of Thin Films on Glassy Carbon Electrodes by Infrared External Reflection Spectroscopy

Marc D. Porter; David L. Allara; Thomas B. Bright; Theodore Kuwana

doi:10.1117/12.970930

20 December 1985 Characterization of Thin Films on Glassy Carbon Electrodes by Infrared External Reflection Spectroscopy

Marc D. Porter, David L. Allara, Thomas B. Bright, Theodore Kuwana

Author Affiliations +

Proceedings Volume 0553, Fourier and Computerized Infrared Spectroscopy; (1985) https://doi.org/10.1117/12.970930
Event: 1985 International Conference on Fourier and Computerized Infrared Spectroscopy, 1985, Ottawa, Canada

Abstract

The utility of infrared external reflection spectroscopy [IR-ERS] for the characterization of thin organic surface structures on nonmetallic substrates, such as glassy carbon [GC], has been examined. Surface sensitivity as a function of the angle of incidence and polarization was determined by calculations of mean-square electric field values [MSEF1. Band shapes for IR-ERS spectra, obtained at optimum conditions for thin films (80-3500 A) of poly(methyl metharcylate) [PMMA] on GC, were severly distorted compared to those obtained with transmission spectroscopy. The IR-ERS spectra were accurately modeled (Â±1096) by classical electromagnetic theory, indicating that the distortions resulted from the inherent physical differences between ERS and transmission measurements.. These results also demonstrated the feasibility of performing quantitative IR-ERS at nonmetallic substrates.

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Marc D. Porter, David L. Allara, Thomas B. Bright, and Theodore Kuwana "Characterization of Thin Films on Glassy Carbon Electrodes by Infrared External Reflection Spectroscopy", Proc. SPIE 0553, Fourier and Computerized Infrared Spectroscopy, (20 December 1985); https://doi.org/10.1117/12.970930

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