Paper
20 December 1985 Lower Limit Of The Thickness Of The Measurable Surface Layer On Infrared Absorbing Substrate By FT-IR-ATR Spectroscopy
Koji Ohta, Reikichi Iwamoto
Author Affiliations +
Proceedings Volume 0553, Fourier and Computerized Infrared Spectroscopy; (1985) https://doi.org/10.1117/12.970926
Event: 1985 International Conference on Fourier and Computerized Infrared Spectroscopy, 1985, Ottawa, Canada
Abstract
Based on verification of Harrick's relation between absorbances of absorption bands and the thickness of the surface layer probed in ATR spectroscopy, we have studied the lower limit of the thickness of a surface layer on an infrared absorbing substrate that can be measured by spectral subtraction of FT-IR-ATR spectra. Spectral observability of a surface layer of a thickness is predictable by comparing the expected absorbances of the bands of the surface layer with the detectable least signal increment obtainable from the noise level of a spectrometer. The limit of the thickness is, in general, 10 to 50 A for polymers.
© (1985) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Koji Ohta and Reikichi Iwamoto "Lower Limit Of The Thickness Of The Measurable Surface Layer On Infrared Absorbing Substrate By FT-IR-ATR Spectroscopy", Proc. SPIE 0553, Fourier and Computerized Infrared Spectroscopy, (20 December 1985); https://doi.org/10.1117/12.970926
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Cited by 2 scholarly publications.
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KEYWORDS
Spectroscopy

Signal detection

Infrared spectroscopy

Infrared radiation

Attenuated total reflectance

Absorption

Fourier transforms

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