2 August 2004 Statistical property of the complex analytic signal of white-light speckle pattern applied to microdisplacement measurement
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Abstract
Under the assumption of Gaussian random process, we discuss the first and the second order statistical properties of the complex amplitude of analytic signal of the white-light speckle pattern. We derive the autocorrelation function of the pseudo phase. Based on these results, we show mathematically that the proposed signal domain phase-only correlation (SD-POC) has advantage over the conventional intensity-based correlation techniques in its performance of micro-displacement measurement. We also present experimental results that support the theory.
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Wei Wang, Nobuo Ishii, Yoko Miyamoto, Mitsuo Takeda, "Statistical property of the complex analytic signal of white-light speckle pattern applied to microdisplacement measurement", Proc. SPIE 5531, Interferometry XII: Techniques and Analysis, (2 August 2004); doi: 10.1117/12.559118; https://doi.org/10.1117/12.559118
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KEYWORDS
Signal analyzers

Statistical analysis

Speckle pattern

Signal processing

Speckle

Detection theory

Electrical engineering

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