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2 August 2004 Application of digital speckle pattern interferometry in measurement of large deformation
Rajesh Kumar; Vikas Rathi; Saba Mirza; Chandra Shakher
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Proceedings Volume 5532, Interferometry XII: Applications; (2004) https://doi.org/10.1117/12.559560
Event: Optical Science and Technology, the SPIE 49th Annual Meeting, 2004, Denver, Colorado, United States
Abstract
In this paper an algorithm to measure large deformations using digital speckle pattern interferometry is presented. It facilitates recording of large number of frames and can subtract them to display speckle correlation fringes with improved signal-to-noise ratio. To further improve signal-to-noise ratio a filtering scheme is also presented by using average/median filtering followed by wavelets filtering. Experimental results and analysis are presented in detail. For a typical displacement of 200 μm, error in measurement was less than 1.5 percent. Range in measurement is governed by change in scattering property of the surface of the object.
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Rajesh Kumar, Vikas Rathi, Saba Mirza, and Chandra Shakher "Application of digital speckle pattern interferometry in measurement of large deformation", Proc. SPIE 5532, Interferometry XII: Applications, (2 August 2004); https://doi.org/10.1117/12.559560
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