Translator Disclaimer
Paper
26 October 2004 High-throughput x-ray microtomography system at the Advanced Photon Source beamline 2-BM
Author Affiliations +
Abstract
X-ray microtomography is rapidly becoming the tool of choice for three-dimensional (3D) imaging of thick structures at the 1-10 µm scale. The fast microtomography system developed at beamline 2-BM of the Advanced Photon Source (APS) is a new class of instrument offering near video-rate acquisition of tomographic data combined with pipelined processing, reconstruction, and visualization. This system can acquire and reconstruct 720 projections (1024x1024 pixels) at 0.25 deg angular increments in under 5 min using a dedicated 32-node computer cluster. At this throughput, hundreds of specimens can be imaged in a 24 h experiment. Alternatively, time-dependent 3D sample evolution can be studied on practical time scales. In this work, we present the current instrument status and the most recent application.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Francesco De Carlo and Brian Tieman "High-throughput x-ray microtomography system at the Advanced Photon Source beamline 2-BM", Proc. SPIE 5535, Developments in X-Ray Tomography IV, (26 October 2004); https://doi.org/10.1117/12.559223
PROCEEDINGS
8 PAGES


SHARE
Advertisement
Advertisement
Back to Top