26 October 2004 Tomographic x-ray absorption spectroscopy
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Abstract
Hard x-ray absorption spectroscopy is combined with scanning microtomography to reconstruct full near edge spectra of an elemental species at each location on an arbitrary virtual section through a sample. These spectra reveal the local concentrations of different chemical compounds of the absorbing element inside the sample and give insight into the oxidation state, the local atomic structure, and the local projected free density of states. The method is implemented by combining a quick scanning monochromator and data acquisition system with a scanning microprobe setup based on refractive x-ray lenses. The full XANES spectra reconstructed at each point of the tomographic slice allow to detect slight variations in concentrations of chemical compounds, such as metallic and monovalent copper. The method is applied to the analysis of a heterogeneous catalyst.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Christian G. Schroer, Marion Kuhlmann, Til Florian Gunzler, Bruno Lengeler, Matthias Richwin, Bernd Griesebock, Dirk Lutzenkirchen-Hecht, Ronald Frahm, Eric Ziegler, Ali Mashayekhi, Dean Haeffner, Jan-Dierk Grunwaldt, Alfons Baiker, "Tomographic x-ray absorption spectroscopy", Proc. SPIE 5535, Developments in X-Ray Tomography IV, (26 October 2004); doi: 10.1117/12.559706; https://doi.org/10.1117/12.559706
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