LEPTOS: a universal software for x-ray reflectivity and diffraction

Alex Ulyanenkov

doi:10.1117/12.563302

Abstract

LEPTOS is a software package for analytical interpretation of data obtained in glancing-incidence X-ray reflectivity and high-resolution X-ray diffraction experiments on thin film structures. The software is designed for comprehensive analysis of physical and crystallographic parameters of modern nanoscale layered structures. The interpretation is based on up-to-date dynamical diffraction approaches and most recent theories of interaction of X-rays with matter. The graphical user interface (GUI) is designed to conveniently work with experimental data, simulate X-ray scattering processes and automatically fit simulations to the measurements using a sample models.

Citation Download Citation

Alex Ulyanenkov, Alex Ulyanenkov, } "LEPTOS: a universal software for x-ray reflectivity and diffraction", Proc. SPIE 5536, Advances in Computational Methods for X-Ray and Neutron Optics, (21 October 2004); doi: 10.1117/12.563302; https://doi.org/10.1117/12.563302

ACCESS THE FULL ARTICLE

PERSONAL SIGN IN
Full access may be available with your subscription

Email or Username Forgot your username?

Password Forgot your password?

Show

Remember Email/Username on this computer

Remember Password

No SPIE account? Create an account
or Institutional Sign In via Shibboleth

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $14.40

Non-members: $18.00 ADD TO CART

Show All Keywords

Keywords/Phrases

Search In:

Publication Years