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21 October 2004 Development of energy-discriminate CdTe imaging detector for hard x-ray
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Abstract
Energy discriminate type CdTe imaging detector was developed for hard X-ray imaging. The device has 4 x 128 structured 512 semi-linear M-π-n CdTe pixels with 0.5 mm pixel pitch and 256 mm length. Each pixel was 2mm x 0.8 mm size and connected to photon-counting type data processing circuit integrated as 64ch ASIC. The ASIC could be operated at high speed over 1M cps and it has 5 levels of energy discriminated thresholds and 15bit counter with each thresholds levels. The imaging detector was designed for energy discriminated hard X-ray imaging using X-ray tube source, since its high incident rate correspondence by high speed operating. The detector was consisted by 512-CdTe detector chips, 8-ASICs with control digital circuits, system control MPU, interface device and high-voltage source in the detector unit, and connected to conventional laptop personal computer thorough USB2.0 interface. In this study, we build energy-discriminated X-ray penetrating imaging system with this CdTe 512 pixels imaging detector unit, 90keV micro-focus X-ray source, mechanical scanning system and imaging software. The energy discriminate X-ray penetrating imaging was carried out by this system.
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Toru Aoki, Yu Ishida, Daisuke Sakashita, Volodymyr A. Gnatyuk, Atsushi Nakamura, Yasuhiro Tomita, Yoshinori Hatanaka, and Jiro Temmyo "Development of energy-discriminate CdTe imaging detector for hard x-ray", Proc. SPIE 5540, Hard X-Ray and Gamma-Ray Detector Physics VI, (21 October 2004); https://doi.org/10.1117/12.559479
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