22 October 2004 Convergence of phase inversion for simple crystal shapes using coherent x-ray diffraction
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Abstract
The penetrating nature and atomic-scale wavelength of X-ray radiation makes the possibility of an X-ray microscope a very exciting prospect. Unfortunately, existing X-ray optics are far less efficient than their visible light counterparts. An attractive alternative to optics is computational inversion of the far-field coherent X-ray diffraction (CXD), which can be measured using modern X-ray sources. Thus we seek to defeat the so-called phase problem by iteratively seeking a set of phases consistent with the CXD measurement and some physical real-space constraints. We have found the behavior of fitting algorithms to be qualitatively different for simulated diffraction patterns and measured coherent X-ray intensity patterns. We will compare the convergence of the inversion of CXD patterns from simply shaped metal crystals with simulation.
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Garth J. Williams, Garth J. Williams, Mark A. Pfeifer, Mark A. Pfeifer, Ivan A. Vartaniants, Ivan A. Vartaniants, Ian K. Robinson, Ian K. Robinson, } "Convergence of phase inversion for simple crystal shapes using coherent x-ray diffraction", Proc. SPIE 5562, Image Reconstruction from Incomplete Data III, (22 October 2004); doi: 10.1117/12.565062; https://doi.org/10.1117/12.565062
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