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22 October 2004 Convergence of phase inversion for simple crystal shapes using coherent x-ray diffraction
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Abstract
The penetrating nature and atomic-scale wavelength of X-ray radiation makes the possibility of an X-ray microscope a very exciting prospect. Unfortunately, existing X-ray optics are far less efficient than their visible light counterparts. An attractive alternative to optics is computational inversion of the far-field coherent X-ray diffraction (CXD), which can be measured using modern X-ray sources. Thus we seek to defeat the so-called phase problem by iteratively seeking a set of phases consistent with the CXD measurement and some physical real-space constraints. We have found the behavior of fitting algorithms to be qualitatively different for simulated diffraction patterns and measured coherent X-ray intensity patterns. We will compare the convergence of the inversion of CXD patterns from simply shaped metal crystals with simulation.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Garth J. Williams, Mark A. Pfeifer, Ivan A. Vartaniants, and Ian K. Robinson "Convergence of phase inversion for simple crystal shapes using coherent x-ray diffraction", Proc. SPIE 5562, Image Reconstruction from Incomplete Data III, (22 October 2004); https://doi.org/10.1117/12.565062
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