8 September 2004 Application of modified method of m-line spectroscopy to optical research of anisotropic materials
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Proceedings Volume 5576, Lightguides and their Applications II; (2004); doi: 10.1117/12.581734
Event: Lightguides and their Applications II, 2003, Krasnobrod, Poland
Abstract
Determination of planar waveguide parameters with a deposited thin layer such as a refractive index and thickness by the method of m-line spectroscopy is possible. Application of the method to determination of thin film parameters of anisotropy material has been presented in this paper. Depositing of a very small quantity of the material on the planar waveguide changes propagation depending on a texture of a crystal. Liquid crystal (LC) is typical material characterizing the texture. Optical parameters of anisotropic materials (LC) have been determined by the modified m-line spectroscopy in four-layer waveguide structures. Preliminary investigation of application of this method to the study of anisotropic materials has been confirmed.
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Elzbieta Augusciuk, "Application of modified method of m-line spectroscopy to optical research of anisotropic materials", Proc. SPIE 5576, Lightguides and their Applications II, (8 September 2004); doi: 10.1117/12.581734; https://doi.org/10.1117/12.581734
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KEYWORDS
Waveguides

Liquid crystals

Spectroscopy

Refractive index

Thin films

Geometrical optics

Planar waveguides

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