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20 December 2004 Sensing properties of surface plasmon resonance in different multilayer Si-based structures
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Abstract
The progress in the development of Si-based Surface Plasmon Resonance sensing technology is reported. This technology uses multi-layer structures with a gold film and a silicon prism in the Kretschmann-Raether geometry and makes potentially possible the miniaturization and integration of the sensor device on a silicon-based microplatform. We show conditions of the simultaneous excitation for two plasmon polariton modes over both sides of the gold film using different intermediate layers, between the high-refractive index silicon prism and the gold, and examine their response in configurations of the conventional and nanoparticle-enhanced sensing. The system has been calibrated in real-time measurements of protein (Concanavalin A) adsorption.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Sergiy Patskovsky, Andrei V. Kabashin, Michel Meunier, and John H.T. Luong "Sensing properties of surface plasmon resonance in different multilayer Si-based structures", Proc. SPIE 5577, Photonics North 2004: Optical Components and Devices, (20 December 2004); https://doi.org/10.1117/12.567689
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