A low-cost time-resolved spot diagnostic for flash x-ray machines

J. Howorth; Martin B. Ingle; Peter Simpson; Christopher Aedy; Stephen Quillin

doi:10.1117/12.584620

17 March 2005 A low-cost time-resolved spot diagnostic for flash x-ray machines

J. Howorth, Martin B. Ingle, Peter Simpson, Christopher Aedy, Stephen Quillin

Proceedings Volume 5580, 26th International Congress on High-Speed Photography and Photonics; (2005) https://doi.org/10.1117/12.584620
Event: 26th International Congress on High-Speed Photography and Photonics, 2004, Alexandria, Virginia, United States

Abstract

AWE has embarked on a programme to develop an improved intense electron beam diode for flash x-ray radiography machines. In order to understand the performance of the diode and to validate computer modelling codes, there is a requirement to obtain time resolved x-ray spot size and position data during the 50 ns electron beam pulse. A simple, low cost, time resolved spot diagnostic has been designed in collaboration with Photek Limited. The system is based around number of identical, single frame, fast gating intensified CCD camera modules viewing a very fast organic scintillator. Each camera has an independent internal delay generator and a microchannel plate intensifier (MCP) capable of gate widths down to 1 ns. The complete system is battery driven and controlled remotely via optical fibres to provide electrical isolation and reduce Electro Magnetic Interference (EMI) susceptibility. An initial four frame system (easily extendable to 8 frames and beyond) has been developed and deployed successfully on one of AWE’s flash x-ray machines.

Citation Download Citation

J. Howorth, Martin B. Ingle, Peter Simpson, Christopher Aedy, and Stephen Quillin "A low-cost time-resolved spot diagnostic for flash x-ray machines", Proc. SPIE 5580, 26th International Congress on High-Speed Photography and Photonics, (17 March 2005); https://doi.org/10.1117/12.584620

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