Single sub-fs XUV pulses: generation and measurement

Reinhard Kienberger; Ferenc Krausz

doi:10.1117/12.580483

17 March 2005 Single sub-fs XUV pulses: generation and measurement

Reinhard Kienberger, Ferenc Krausz

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Proceedings Volume 5580, 26th International Congress on High-Speed Photography and Photonics; (2005) https://doi.org/10.1117/12.580483
Event: 26th International Congress on High-Speed Photography and Photonics, 2004, Alexandria, Virginia, United States

Abstract

The change from a zero transition to the maximum amplitude of the electric field of visible light lasts shorter than one femtosecond (1 fs = 10^-15 s). By precisely controlling the hyperfast electric field oscillations in a short laser pulse we developed a measuring apparatus - the Atomic Transient Recorder (ATR) - like an ultrafast stopwatch. This apparatus is capable of measuring the duration of atomic processes with an accuracy of less than 100 attoseconds (1 as = 10^-18 s) which is the typical duration of electronic processes (transients) deep inside atoms. A 250 attosecond X-ray pulse initiates the atomic process to be measured and the attosecond stopwatch at the same time. This new measuring method now allows for the first time the observation of ultrafast processes in the electron shell of atoms.

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Reinhard Kienberger and Ferenc Krausz "Single sub-fs XUV pulses: generation and measurement", Proc. SPIE 5580, 26th International Congress on High-Speed Photography and Photonics, (17 March 2005); https://doi.org/10.1117/12.580483

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