Localization and shot noise in nanostructures

A. F. Mehdi Anwar

doi:10.1117/12.581346

29 December 2004 Localization and shot noise in nanostructures

A. F. Mehdi Anwar

Proceedings Volume 5593, Nanosensing: Materials and Devices; (2004) https://doi.org/10.1117/12.581346
Event: Optics East, 2004, Philadelphia, Pennsylvania, United States

Abstract

Nano-structures are increasingly finding more applications in modern electronic/photonic devices. However, an accurate prediction of the nano-device performance is complicated by carrier localization and, in certain applications, the presence of an applied magnetic field. Shot noise measurements are suggested as a means to quantify localization. An alternative technique using tunneling time to characterize localization in nano-structures in the presence of random elastic and inelastic scattering is presented. The treatment is extended to include the effect of magnetic fields. The calculations are carried out self-consistently by solving Schroedinger and Poisson's equations for the accurate determination of the developed space charge.

Citation Download Citation

A. F. Mehdi Anwar "Localization and shot noise in nanostructures", Proc. SPIE 5593, Nanosensing: Materials and Devices, (29 December 2004); https://doi.org/10.1117/12.581346

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available