16 December 2004 Design and fabrication of digital dual-frequency patterns for projected fringe profilometry
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Abstract
One key problem of fringe projection techniques for 3D shape measurements is the limited phase unambiguity range when only one grating period is used. Dual-frequency patterns in which involves two grating periods can easily extend the unambiguity range. A method to fabricate accurate dual-frequency patterns is presented. The advantage of using digital dual-frequency patterns for projected fringe profilometry are (1) high geometrical accuracy (< 0.5μm); (2) high contrast ratio; (3) very low high order harmonic distortions; and (4) extended unambiguity range.
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Wei-Hung Su, Wei-Hung Su, Yi-Ling Hsu, Yi-Ling Hsu, Cho-Yo Kuo, Cho-Yo Kuo, Hong-Ming Chen, Hong-Ming Chen, Wei-Chen Su, Wei-Chen Su, Shizhuo Yin, Shizhuo Yin, } "Design and fabrication of digital dual-frequency patterns for projected fringe profilometry", Proc. SPIE 5606, Two- and Three-Dimensional Vision Systems for Inspection, Control, and Metrology II, (16 December 2004); doi: 10.1117/12.569992; https://doi.org/10.1117/12.569992
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