Translator Disclaimer
Paper
1 November 2004 Parametric PSF estimation via sparseness maximization in the wavelet domain
Author Affiliations +
Proceedings Volume 5607, Wavelet Applications in Industrial Processing II; (2004) https://doi.org/10.1117/12.571539
Event: Optics East, 2004, Philadelphia, Pennsylvania, United States
Abstract
Image degradation is a frequently encountered problem in different imaging systems, like microscopy, astronomy, digital photography, etc. The degradation is usually modeled as a convolution with a blurring kernel (or Point Spread Function, psf) followed by noise addition. Based on the combined knowledge about the image degradation and the statistical features of the original images, one is able to compensate at least partially for the degradation using so-called image restoration algorithms and thus retrieve information hidden for the observer. One problem is that often this blurring kernel is unknown, and has to be estimated before actual image restoration can be performed. In this work, we assume that the psf can be modeled by a function with a single parameter, and we estimate the value of this parameter. As an example of such a single-parametric psf, we have used a Gaussian. However, the method is generic and can be applied to account for more realistic degradations, like optical defocus, etc.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Filip Rooms, Wilfried R. Philips, and Javier Portilla "Parametric PSF estimation via sparseness maximization in the wavelet domain", Proc. SPIE 5607, Wavelet Applications in Industrial Processing II, (1 November 2004); https://doi.org/10.1117/12.571539
PROCEEDINGS
8 PAGES


SHARE
Advertisement
Advertisement
RELATED CONTENT

Scene-based blind deconvolution image and PSF estimation
Proceedings of SPIE (September 13 2011)
Regularized image restoration in nuclear medicine
Proceedings of SPIE (October 26 1999)
Inverse halftoning using a shearlet representation
Proceedings of SPIE (September 04 2009)

Back to Top