Image processing of standard grading scales for objective assessment of contact lens wear complications

Elisabet Perez-Cabre; Maria Sagrario Millan; Hector C. Abril; E. Otxoa

doi:10.1117/12.590704

21 October 2004 Image processing of standard grading scales for objective assessment of contact lens wear complications

Elisabet Perez-Cabre, Maria Sagrario Millan, Hector C. Abril, E. Otxoa

Proceedings Volume 5622, 5th Iberoamerican Meeting on Optics and 8th Latin American Meeting on Optics, Lasers, and Their Applications; (2004) https://doi.org/10.1117/12.590704
Event: 5th Iberoamerican Meeting on Optics and 8th Latin American Meeting on Optics, Lasers, and Their Applications, 2004, Porlamar, Venezuela

Abstract

Ocular complications in contact lens wearers are usually graded by specialists using visual inspection and comparing with established standards. The standard grading scales consist of either a set of illustrations or photographs ordered from a normal situation to a severe complication. In this work, an objective assessment of contact lens wear complications is intended by applying different image processing techniques to two standard grading scales (Efron and CCLRU grading scales). In particular, conjunctival hyperemia and papillary conjunctivitis are considered. Given a set of standard illustrations or pictures for each considered ocular disorder, image preprocessing is needed to compare equivalent areas. Histogram analysis allows segmenting vessel and background pixel populations, which are used to determine the most relevant features in the measurement of contact lens effects. Features such as color, total area of vessels and vessel length are used to evaluate bulbar and lid redness. The procedure to obtain an automatic grading method by digital image analysis of standard grading scales is described.

Citation Download Citation

Elisabet Perez-Cabre, Maria Sagrario Millan, Hector C. Abril, and E. Otxoa "Image processing of standard grading scales for objective assessment of contact lens wear complications", Proc. SPIE 5622, 5th Iberoamerican Meeting on Optics and 8th Latin American Meeting on Optics, Lasers, and Their Applications, (21 October 2004); https://doi.org/10.1117/12.590704

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