Measurement of the third order nonlinear coefficients of organic materials by a holographic technique in the picosecond regime

L. Rodriguez; Christos Simos; Mamadou Sylla; Aristides Alfredo Marcano O.; Xuan Nguyen Phu

doi:10.1117/12.589229

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21 October 2004 Measurement of the third order nonlinear coefficients of organic materials by a holographic technique in the picosecond regime

L. Rodriguez, Christos Simos, Mamadou Sylla, Aristides Alfredo Marcano O., Xuan Nguyen Phu

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Proceedings Volume 5622, 5th Iberoamerican Meeting on Optics and 8th Latin American Meeting on Optics, Lasers, and Their Applications; (2004) https://doi.org/10.1117/12.589229
Event: 5th Iberoamerican Meeting on Optics and 8th Latin American Meeting on Optics, Lasers, and Their Applications, 2004, Porlamar, Venezuela

Abstract

We have developed a method which yields the real and the imaginary parts of third-order susceptibility of material media. We have applied this method to determine the nonlinear refractive index (n₂) of new synthesized organic materials in the picosecond regime (30 ps pulse duration at 1064 nm wavelength). The results obtained show the efficiency of this technique for measuring low values of the nonlinear refraction coefficient n₂ in diluted materials.

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L. Rodriguez, Christos Simos, Mamadou Sylla, Aristides Alfredo Marcano O., and Xuan Nguyen Phu "Measurement of the third order nonlinear coefficients of organic materials by a holographic technique in the picosecond regime", Proc. SPIE 5622, 5th Iberoamerican Meeting on Optics and 8th Latin American Meeting on Optics, Lasers, and Their Applications, (21 October 2004); https://doi.org/10.1117/12.589229

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