21 October 2004 Phase measurement in digital speckle pattern interferometry using wavelet transforms: recent developments
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Proceedings Volume 5622, 5th Iberoamerican Meeting on Optics and 8th Latin American Meeting on Optics, Lasers, and Their Applications; (2004) https://doi.org/10.1117/12.591606
Event: 5th Iberoamerican Meeting on Optics and 8th Latin American Meeting on Optics, Lasers, and Their Applications, 2004, Porlamar, Venezuela
Abstract
This presentation reviews recent developments carried out by the authors to evaluate phase distributions in digital speckle pattern interferometry (DSPI) using wavelet analysis. The advantage of this approach is that it requires only one interferogram to be analyzed and does not need the application of a phase unwrapping algorithm neither the introduction of carrier fringes in the interferometer. In particular, it is presented an approach that takes into account the second order contribution of the phase map. It is also presented the application of a smoothed time-frequency distribution which improves the accuracy of the results obtained in the neighborhood of stationary phase points and also when the generated DSPI fringes present discontinuities in the first derivative of the phase map.
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Alejandro Federico, Guillermo H. Kaufmann, "Phase measurement in digital speckle pattern interferometry using wavelet transforms: recent developments", Proc. SPIE 5622, 5th Iberoamerican Meeting on Optics and 8th Latin American Meeting on Optics, Lasers, and Their Applications, (21 October 2004); doi: 10.1117/12.591606; https://doi.org/10.1117/12.591606
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