21 October 2004 Speckle pattern illumination: two applications
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Proceedings Volume 5622, 5th Iberoamerican Meeting on Optics and 8th Latin American Meeting on Optics, Lasers, and Their Applications; (2004) https://doi.org/10.1117/12.591694
Event: 5th Iberoamerican Meeting on Optics and 8th Latin American Meeting on Optics, Lasers, and Their Applications, 2004, Porlamar, Venezuela
Abstract
The speckle pattern produced by a translucent diffuser which is itself illuminated by another speckle pattern is studied. The decorrelation of the resultant speckle pattern by a lateral displacement of the diffusing surface is shown to be related to the standard deviation of the slope's distribution and to the illuminating speckle grain size. Therefore, measuring the intensity decorrelation as a function of the surface displacement it is possible to obtain information about the diffuser slope distribution. Reciprocally, we show that a statistically characterized diffuser can be used to measure the mean size of the illuminating speckle grain.
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Fernando Perez Quintian, Fernando Perez Quintian, Maria A. Rebollo, Maria A. Rebollo, } "Speckle pattern illumination: two applications", Proc. SPIE 5622, 5th Iberoamerican Meeting on Optics and 8th Latin American Meeting on Optics, Lasers, and Their Applications, (21 October 2004); doi: 10.1117/12.591694; https://doi.org/10.1117/12.591694
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