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21 October 2004 Spectroscopic analysis of signals from LIBS experiments
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Proceedings Volume 5622, 5th Iberoamerican Meeting on Optics and 8th Latin American Meeting on Optics, Lasers, and Their Applications; (2004) https://doi.org/10.1117/12.591209
Event: 5th Iberoamerican Meeting on Optics and 8th Latin American Meeting on Optics, Lasers, and Their Applications, 2004, Porlamar, Venezuela
Abstract
In the LIBS experiences (Laser Induced Breakdown Spectroscopy), in particular those carried out at atmospheric pressure, the observed atomic lines present a high absorption which is a setback in order to employ the measured line intensities to calibrate the element concentration in the samples. Absorption mainly occurs in the strongest lines of the spectrum and, consequently, those with the biggest probability of detection in a multi-element plasma. With the goal of quantifying some element in a laser-induced plasma several procedures are used. The most widely known is constructing calibration curves. In contrast, free-calibration methods are already available. The latter requires knowing plasma parameters and equilibrium (LTE) and optically thin plasma conditions are assumed. In both cases the experimental measurement of absorbed lines leads to errors in the concentration calculus. In this paper, working methods under optically thick inhomogeneous plasma conditions are studied. Considering information deduced from the optical thickness of the measured spectral lines quantification of trace elements in the samples is achieved. The optical thickness is responsible of line saturation. It is related to the emitting species density, the electronic temperature and concerned spectral line.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
C. D'Angelo, D. Diaz Pace, D. Bertuccelli, and G. Bertuccelli "Spectroscopic analysis of signals from LIBS experiments", Proc. SPIE 5622, 5th Iberoamerican Meeting on Optics and 8th Latin American Meeting on Optics, Lasers, and Their Applications, (21 October 2004); https://doi.org/10.1117/12.591209
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