Paper
31 January 2005 Fabrication of high-speed and reliable 850nm oxide-confined VCSELs for 10Gb/s data communication
Hao-Chung Kuo, Y H. Chang, Y. A. Chang, K. F. Tseng, L. H. Laih, S. C. Wang, Hsin-Chieh Yu, Chia-Pin Sung, Hung-Pin D. Yang
Author Affiliations +
Abstract
In this paper, we demonstrate high performance 850 nm InGaAsP/InGaP strain-compensated MQWs vertical-cavity surface-emitting lasers (VCSELs). These VCSELs exhibit superior performance with threshold currents of ~0.4 mA, and slope efficiencies of ~ 0.6 mW/mA. High modulation bandwidth of 14.5 GHz and modulation current efficiency factor of 11.6 GHz/(mA)1/2 are demonstrated. We have accumulated life test data up to 1000 hours at 70°C/8mA. In addition, we also report a high speed planarized 850nm oxide-implanted VCSELs process that does not require semi-insulating substrates, polyimide planarization process, or very small pad areas, therefore very promising in mass manufacture.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hao-Chung Kuo, Y H. Chang, Y. A. Chang, K. F. Tseng, L. H. Laih, S. C. Wang, Hsin-Chieh Yu, Chia-Pin Sung, and Hung-Pin D. Yang "Fabrication of high-speed and reliable 850nm oxide-confined VCSELs for 10Gb/s data communication", Proc. SPIE 5624, Semiconductor and Organic Optoelectronic Materials and Devices, (31 January 2005); https://doi.org/10.1117/12.577050
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KEYWORDS
Vertical cavity surface emitting lasers

Modulation

Gallium

Capacitance

Oxides

Aluminum

Picosecond phenomena

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