26 January 2005 Paraxial analysis of stray light caused by multi-order diffraction and multireflection
Author Affiliations +
Proceedings Volume 5627, High-Power Lasers and Applications III; (2005); doi: 10.1117/12.577016
Event: Photonics Asia, 2004, Beijing, China
Abstract
Diffraction components are applied in high power laser systems for beam shaping and harmonic separation. Because of the multi-order diffraction and multi-reflection to high power laser, the distributions of stray light energy and ghosts are much more completed in the systems than in conventional optical systems. In this paper a data structure of tree is presented for describing the stray light caused by multi-order diffraction and multi-reflection. All the nodes of the tree can be dynamically saved and be deleted, and the intermediate results those are useful for the next calculation step can be reserved in RAM. Using this method the multiple repeated calculations in conventional stray light analysis methods such as Monte Carlo technique are avoided and the analysis time is reduced. According to the paraxial tracing, the software which can be used for analyzing the stray light caused by multi-order diffraction and multi-reflection in high power laser systems is developed and the stray light tree of a laser system based on paraxial tracing is built. As shown by the example that this algorithm is available for quickly analyzing stray light in the systems including diffraction components, and the ghost positions with energy descriptions can be given by the software. The ghosts those are harmful to the important components will be picked.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Xiaotong Li, Zhaofeng Cen, Haofei Liu, Shitao Deng, Qihua Zhu, Fang Wang, Hongjie Liu, "Paraxial analysis of stray light caused by multi-order diffraction and multireflection", Proc. SPIE 5627, High-Power Lasers and Applications III, (26 January 2005); doi: 10.1117/12.577016; https://doi.org/10.1117/12.577016
PROCEEDINGS
5 PAGES


SHARE
KEYWORDS
Stray light

Diffraction

High power lasers

Laser systems engineering

Reflection

Reflectivity

Stray light analysis

RELATED CONTENT

Internal thermal emission analysis of an IR seeker
Proceedings of SPIE (September 16 1992)
Using differential ray tracing in stray light analysis
Proceedings of SPIE (October 15 2012)
Stray Light Simulation With Advanced Monte Carlo Techniques
Proceedings of SPIE (September 26 1977)
Stray light analysis of basic model Gaussian beam
Proceedings of SPIE (September 05 2002)

Back to Top