Translator Disclaimer
13 January 2005 Numerical analysis of the temperature field in PbS detector by pulse laser irradiation
Author Affiliations +
Abstract
The time-dependent optical reflectivity of HgCdTe detector at 0.63μm has been measured during irradiating by a 1.06-μm Q-switched Nd:YAG laser of 50-ns duration. The reflectivity was observed to increase abruptly to a value and to remain at that value for a period of time, which ranged from several nanoseconds to several hundreds of nanoseconds, depending on the irradiating pulse intensity. The duration of the “flat-top” portion of the reflectivity waveform represents the total time that the surface is melting. Subsequently, the reflectivity dropped abruptly to a value less than the initial one. The difference shows that the damage takes place in the incidence point. By measuring the time-resolved reflectivity and simulating physical structures of PbS and HgCdTe detector, whose dynamic mathematical model was created. By solving the equations of energy transport and thermal diffusion, the temperature rises of PbS and HgCdTe detector irradiated by pulse laser beam were studied, the relationship of power and temperature rises were discussed and the numerical solutions of dynamic temperature field were obtained. The experimental result of the reflectivity of HgCdTe detector was compared with calculated result. The results show finite element analysis is effective in solving the temperature field.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Song Li, Jinjing Feng, Jixiang Yan, and Shouhuan Zhou "Numerical analysis of the temperature field in PbS detector by pulse laser irradiation", Proc. SPIE 5629, Lasers in Material Processing and Manufacturing II, (13 January 2005); https://doi.org/10.1117/12.573221
PROCEEDINGS
8 PAGES


SHARE
Advertisement
Advertisement
RELATED CONTENT


Back to Top