Translator Disclaimer
Paper
6 May 1985 Experience With The In Situ Monitor System For The Fabrication Of X-Ray Mirrors
Author Affiliations +
Abstract
Practical consideration for the fabrication of multilayer x-ray mirrors using in situ monitoring of the reflectivity for soft x-rays during deposition are discussed.
© (1985) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Eberhard Spiller "Experience With The In Situ Monitor System For The Fabrication Of X-Ray Mirrors", Proc. SPIE 0563, Applications of Thin Film Multilayered Structures to Figured X-Ray Optics, (6 May 1985); https://doi.org/10.1117/12.949689
PROCEEDINGS
11 PAGES


SHARE
Advertisement
Advertisement
RELATED CONTENT

Replicated multilayer x-ray mirrors
Proceedings of SPIE (January 13 2004)
Low atomic number coating for XEUS silicon pore optics
Proceedings of SPIE (July 15 2008)
X ray study of W Si multilayers for the HEFT...
Proceedings of SPIE (January 29 2004)
Toward a hard x-ray telescope for solar flares
Proceedings of SPIE (November 28 2000)
Performance of multilayer coated silicon pore optics
Proceedings of SPIE (July 29 2010)

Back to Top