Translator Disclaimer
14 February 2005 Full-range linear birefringence mapping: application to the characterization of half-wave plate
Author Affiliations +
Abstract
In this investigation, an interferometric scheme is developed to determine the linear birefringent parameters of wave plate in full range. A commercially available Soliel Babinet compensator and a half wave plate are taken as sample to demonstrate the capability of two-dimensional measurement. Since images are obtained with respect to different polarization orientations of a linearly polarized incident laser beam, the measurement speed can be improved once the polarization orientation adjustment is achieved electronically. The measurement is also independent of non-uniform distribution of laser intensity, this is demonstrated experimentally and briefly explained theoretically. In addition, the 2-D distribution of residual linear birefringent parameters is also demonstrated.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hui-Kang Teng, Kuo-Chen Lang, and Chun-Chen Yen "Full-range linear birefringence mapping: application to the characterization of half-wave plate", Proc. SPIE 5634, Advanced Sensor Systems and Applications II, (14 February 2005); https://doi.org/10.1117/12.570056
PROCEEDINGS
11 PAGES


SHARE
Advertisement
Advertisement
Back to Top