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10 February 2005 Experimental research on thickness-monitoring techniques of non-quarter films
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Abstract
The precise control of the film thickness in the film deposition process is the key to depositing optical coating, it is difficult to get ideal film thickness by general turn-point value monitoring. The characteristics of four film thickness monitoring techniques, quartz crystal monitoring technique and common reflectance overshoot-turning point monitoring technique and turn-point monitoring technique with different monitoring wavelength at each layer and mutative overshoot-turning point monitoring technique, are analyzed in this thesis. The contrast experiments adopting the four monitoring techniques respectively to a non-quarter A.R. coating were made under the same technical condition. The experiment results have indicated that mutative overshoot-turning point monitoring technique can get more precise thickness control to non-quarter films than the other thickness monitoring techniques.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Xiaohui Zhang, Xiaodan Gao, and Jionghui Rao "Experimental research on thickness-monitoring techniques of non-quarter films", Proc. SPIE 5638, Optical Design and Testing II, (10 February 2005); https://doi.org/10.1117/12.576190
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