Influence of edge error on MTF

Chun-mei Xu; Wei Zhang; Gang Li; Chu Zhang

doi:10.1117/12.576810

10 February 2005 Influence of edge error on MTF

Chun-mei Xu, Wei Zhang, Gang Li, Chu Zhang

Proceedings Volume 5638, Optical Design and Testing II; (2005) https://doi.org/10.1117/12.576810
Event: Photonics Asia, 2004, Beijing, China

Abstract

Using a knife-edge to measure the MTF of optical system is a basic way, the paper discuss the influence of slit edge error on MTF by building a mathematical model. The quantitative analysis result was given that it can reach the given precision by only measuring limited area. The qualitative analysis result was also given that fitting-curve-method is better than averaging method for precision.

Citation Download Citation

Chun-mei Xu, Wei Zhang, Gang Li, and Chu Zhang "Influence of edge error on MTF", Proc. SPIE 5638, Optical Design and Testing II, (10 February 2005); https://doi.org/10.1117/12.576810

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